Manufacture of sights with high output characteristics is a prerequisite for achieving the necessary accuracy when shooting. The aim of the work was to analyze the influence of pancratic optical sights’ main parameters on their output performance characteristics.

It is shown that in order to achieve the quality level of the world’s best samples, high image quality – no drop in contrast by no more than 30 % of the calculated value, careful manufacturing and control of both mechanical and optical parts, as well as components of the assembly units of products, the technological process of assembly and alignment is necessary.

Bench equipment and test methods which made it possible significantly increase the level of serial production are described, also some characteristics of GS3-12×50, GS3-24×56, GS5-25×56 “NTC “LEMT” BelOMO” are presented.

The work purpose is the development of BSUIM-1 and BSUIM-2 complexes for training specialists in the aerospace industry with the used engineering test beds and experimental facilities.

Two sets of nanosatellite engineering models and ground stations had developed. They allow testing hardware and software of the onboard equipment and payload, simulating operation modes, and flight programs, and enable students to gain practical skills in working with ultra-small satellites. The complexes include ground stations, 2 ultra-small satellite simulators, BSUSAT-1 low-orbit nanosatellite, remote access laboratory, local and external servers for data storage. The complexes' website and database allow for full-time and remote training. The experience gained in conducting experiments, processing telemetry, and structuring information in the database is used for further development. All the developed equipment is made based on commercial off-the-shelf elements. It has reduced development costs, flexible equipment reconfiguration, and easier access to the simulator's internal architecture for demonstration purposes.

The developed complexes allow students to practically study the ultra-small satellite components design and ground stations, methods for receiving and processing telemetry and scientific information, attitude determination and control algorithms. The complexes allow to conduct of research in the development of individual onboard systems and special-purpose equipment of the nanosatellite and their testing in the loop. The results obtained are introduced into the educational process and are used in lectures and laboratory classes for aerospace specialties students. The developed complexes make it possible to carry out term papers, theses, and master’s works related to the design of hardware and software for nanosatellites and a ground station, the setting up of space experiments, the development of new algorithms and a flight program for ultra-small satellites.

Reduction of the systematic error when determining the characteristics of the reference X-ray radiation fields is an essential task according to the ISO 4037-1:2019 standard. This task is especially important in dosimetry laboratories when establishing the qualities of reference photon fields. The aim of the study was to develop a method that allows taking into account the contribution of radiation scattered on the filter when determining the half-value layer of the photon field generated by the X-ray unit. Another goal was to reduce the computational cost of determining this contribution.

One of the major contributors to the systematic error in measuring the half-value layer is the radiation scattered on the filter material. The standard recommends that this error should be taken into account in the measurement. But it does not provide any methodology that would do this.

The study investigated the possibility of reducing the contribution of scattered radiation to the ionization chamber readings when assessing the radiation quality of the X-ray unit by the means of half-value layer. The study utilized the (N, H, L) quality series as reference fields according to ISO 4037-1:2019.

Contribution of the scattered radiation to the half-value layer was compensated with the correction coefficients; they were calculated with the FLUKA Monte Carlo software according to the zero-aperture approximation method. Unlike other similar methods, the proposed approach employs kinetic energy released to matter (kerma), to air in this case, as the main value, which, when utilized instead of deposited energy, reduces the program’s runtime several fold.

Correctness of the results obtained in this work was verified by comparing the calculated values of the half-value layer with the tabulated ones provided in the ISO 4037-1:2019 standard. The deviation of calculated values from those specified in the standard does not exceed 2 %.

Calculation results showed that the error contributed by scattered radiation to the magnitude of the halfvalue layer in direct measurements does not exceed 5 %. The use of the air kerma allowed us to significantly reduce the time for calculating the correction coefficients by the factor of 6–16 times with respect to other methods, depending on the radiation quality series. This made it possible to calculate correction factors for the source-detector distance equal to 2.5 meters.

The exact determination of Vickers HV hardness is important for determining of the product material mechanical properties. An important aspect of measuring HV is to obtain its values on a non-planar surface. Regulatory documents contain table values of correction factors K which depend on the surface shape (convex or concave, spherical or cylindrical), its curvature (diameter D) and hardness (arithmetic mean d of indentation diagonal lengths) but this does not solved the problem. The K values for d/D ratios not given in the tables are determined by interpolation from the closest to the measured tabulated d/D values. The error in the representation of these tabulated d/D values is fully included in the error of determining the K coefficient for the measured d/D ratio. The aim of the work was to simplify the calculation of correction factors K for Vickers hardness measurements on non-planar surfaces and to reduce the calculation error compared to the methodology governed by the regulations.

The method presented is based on a statistical analysis of K coefficients, presented in regulatory documents for cases considered in the form of tables. The sufficiency of using of a quadratic power function for approximating K(d/D) dependences and the necessity of fulfilling the physically justified condition K ≡ 1 at zero curvature of tested surface have been substantiated. Simplification of calculation of K coefficient and decrease of calculation error in comparison with the recommended in the regulatory documents obtaining of K value by linear interpolation relative to two adjacent table values are shown.

The reduction of the calculation error in comparison with the calculation recommended in the regulatory documents occurred because of the reason that when calculating by the developed formulas, the error in the value of the calculated for a specific value of d/D coefficient K is averaged over all n values of d/D given in the table of GOST for a given surface. That is, the error is reduced by a factor of about √n 2 in comparison with the calculation according to the regulated procedure. This is illustrated by the above numerical data and an example of the use of the method.

The obtained formulas for calculation of correction coefficients K when measuring hardness HV on spherical and cylindrical (concave and convex) surfaces are reasonable to use for automatic calculation of HV on items with a non-planar surface.

One of the possible ways of improvement of the surface properties of silicon is the solid phase recrystallization of the surface silicon layer after the chemical-mechanical polishing with application of the rapid thermal treatment with the pulses of second duration. The purpose of the given paper is investigation of influence of the rapid thermal treatment of the initial silicon wafers of the various doping level and reticular density on their optical characteristics by means of the spectral ellipsometry method.

The investigation results are presented by means of the spectral ellipsometry method of the rapid thermal processing influence on the initial silicon wafers (KDB12 orientation <100>, KDB10 orientation <111> and KDB0.005 orientation <100>) of the various level of doping and reticular density influence on their optical characteristics: refraction and absorption ratios. Influence was confirmed of the silicon reticular density on its optical characteristics before and after the rapid thermal processing. It was shown, that reduction of the refraction and absorption ratios in the center of the Brillouin zone for the silicon samples with the high Boron concentration after the rapid thermal processing as compared with the low doped silicon. In the area of the maximum absorption peak, corresponding to the energy of the electron exit from the silicon surface (4.34 eV) the refraction indicator of the high doped silicon becomes higher, than of the low doped silicon, which is determined by the high concentration of the vacant charge carriers on the silicon surface in this spectral range.

It was established, that the spectral area 3.59–4.67 eV, corresponding to the work of the electrons, exiting the silicon surface, the most informative way shows the difference of the 3 optical parameters of silicon of the different orientation, and for evaluation of influence of the silicon doping level on its optical characteristics the most informative is the spectral range of 3.32–4.34 eV.

This work considers a model for measuring non-additive quantities, in particular a model for subjective measurement. The purpose of this work was to develop the measurement theory and form of a measurement model that uses the corrected S. Stevens measurement model.

A generalized structure was considered that included an empirical system, a mathematical system, and a homomorphism of the empirical system into a numerical system. The main shortcomings of classical measurement theories seem to be: 1) homomorphism does not display operations (in this case, one cannot speak of the meaningfulness of the model); and 2) there is no empirical measurement model that could confirm the existence of a homomorphism. To overcome the shortcomings of existing theories a definition of the measurement equation is given. As a result a measurement model is obtained that is free from the shortcomings of classical measurement theories. The model uses the corrected model of S. Stevens and the reflection principle of J. Barzilai.

The measurement model was tested using laws that were obtained empirically. Using the model it is shown that Fechnerʼs empirical law is equivalent to Stevensʼs empirical law. This means that the problem which has attracted attention of many researchers for almost a century, has been solved.

A numerical example demonstrates the possibilities of the proposed measurement model. It is shown that the model can be used for extended analysis of expert assessments.

Any object can have many implementations in the form of digital images and any digital image can be processed many times increasing or decreasing accuracy and reliability. Digital colorimetry faces the need to work out issues of ensuring accuracy, metrological traceability and reliability. The purpose of this work was to generalize approaches to the description of multidimensional quantized spaces and show the possibilities of their adaptation to digital colorimetry. This approach will minimize the private and global risks in measurements.

For color identification digital colorimetry uses standard color models and spaces. Most of them are empirical and are improved during the transition from standard to real observation conditions taking into account the phenomena of vision and the age of observers. From the point of view of measurement, a digital image can be represented by a combinatorial model of an information and measurement channel with the appearance of the phenomenon of a color covariance hypercube requiring a significant amount of memory for data storage and processing. The transition from the covariance hypercube to high-dimensional matrices and tensors of the first, second and higher ranks provides the prospect of optimizing the color parameters of a digital image by the criterion of information entropy.

Tensor calculus provides opportunities for expanding the dynamic range in color measurements describing multidimensional vector fields and quantized spaces with indexing tensors and decomposing them into matrices of low orders.

The proposed complex approach based on tensor calculus. According to this approach the color space is a set of directed vector fields undergoing sampling, quantization and coding operations. Also it is a dynamic open system exchanging information with the environment at a given level and to identify color with specified levels of accuracy, reliability, uncertainty and entropy.

The manufacture of products using additive technologies is accompanied by the unpredictable appearance of inhomogeneity of properties, anisotropy, residual stresses, porosity, and other defects. Therefore, there is a great relevance of non-destructive quality control of products obtained by additive technologies. The purpose of the paper is the experimental investigation of the possibility of testing and evaluation of the quality of heat treatment of three-dimensional and cast samples by non-destructive control methods.

The low-alloy steel 09G2S samples, which was obtained by casting and selective laser sintering different modes of subsequent heat treatments were studied. The method of the Barkhausen effect and the instrumented indentation method for measuring the material hardness were applied.

It was experimentally established that both methods are highly sensitive to annealed and normalized three-dimensional samples and their rejection. Compared to the hardness measurement method, which is mainly associated with phase-structural changes, the magnetic noise method due to selectivity to other controlled parameters is additionally sensitive to cast samples (at the same time the microstructures of cast and normalized three-dimensional samples are close to each other according to X-ray data).

The magnetic noise method can be used as one of the physical methods for evaluation the quality and control of the heat treatment of 3D samples at the manufacturing stage when testing their types and modes, as well as sorting samples.