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Devices and Methods of Measurements

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For citations:

Zharin A.L., Gasenkova I.V., Tyavlovsky A.K., Mukhurov N.I., Spitski S.I. Detection of Hidden Defects Induced by Thermomechanical Processing of Aluminum Substrates for Sensor Devices Using a Scanning Kelvin Probe. Devices and Methods of Measurements. 2025;16(1):47-54. https://doi.org/10.21122/2220-9506-2025-16-1-47-54



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ISSN 2220-9506 (Print)
ISSN 2414-0473 (Online)

Belarusian National Technical University
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Phone: +375 17 293 96 67
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