For citations:

Poklonski N.A., Siahlo A.I., Shnitko V.T., Merkulov V.A., Davidenia O.M., Kovalev A.I. FAST METHOD OF NON-CONTACT MICROWAVE MEASUREMENTS OF ELECTRICAL PARAMETERS OF COMPACT SAMPLES. Devices and Methods of Measurements. 2013;(1):64-71. (In Russ.)