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Devices and Methods of Measurements

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For citations:

Ksenevich V.K., Dorosinets V.A., Samarina M.A., Poklonski N.A., Svito I.A., Adamchuk D.V., Abdurakhmanov G. Disordered Tin Oxide Films for Thermoelectric Applications: Correlation between Microstructure, Electrical Conductivity and Seebeck Coefficient. Devices and Methods of Measurements. 2025;16(2):87-97. https://doi.org/10.21122/2220-9506-2025-16-2-87-97



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ISSN 2220-9506 (Print)
ISSN 2414-0473 (Online)

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