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Devices and Methods of Measurements

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For citations:

Brinkevich D.I., Grinyuk E.V., Prosolovich V.S., Brinkevich S.D., Kolos V.V., Zubova O.A. Reflective Absorption IR Fourier-Spectroscopy of Photoresistive Films on Silicon. Devices and Methods of Measurements. 2025;16(1):69-76. (In Russ.) https://doi.org/10.21122/2220-9506-2025-16-1-69-76



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ISSN 2220-9506 (Print)
ISSN 2414-0473 (Online)

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