For citations:

Poklonski N.A., Anikeev I.I., Vyrko S.A. Low-Frequency Admittance of Capacitor with Working Substance “Insulator–Partially Disordered Semiconductor– Insulator”. Devices and Methods of Measurements. 2021;12(3):202-210. https://doi.org/10.21122/2220-9506-2021-12-3-202-210