For citations:
Solodukha V.A., Chigir G.G., Pilipenko V.A., Filipenya V.A., Gorushko V.A. Reliability Express Control of the Gate Dielectric of Semiconductor Devices. Devices and Methods of Measurements. 2018;9(4):308-313. (In Russ.) https://doi.org/10.21122/2220-9506-2018-9-4-308-313
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