For citations:
Odzhaev V.B., Pyatlitski A.N., Prosolovich V.S., Filipenya V.A., Shvedau S.V., Chernyi V.V., Yavid V.Yu., Yankouski Yu.N. QUALITY ANALYSIS OF THE GATE DIELECTRIC OF THE MOS-STRUCTURES BY CAPACITY-VOLTAGE CHARACTERISTICS. Devices and Methods of Measurements. 2015;6(1):94-98. (In Russ.)
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