For citations:
Chizhik S.A., Siroezhlin S.V. SCANNING PROBE TECHNIQUES IN MICRO- AND NANOMECHANICS. Devices and Methods of Measurements. 2010;(1):85-94. (In Russ.)
Chizhik S.A., Siroezhlin S.V. SCANNING PROBE TECHNIQUES IN MICRO- AND NANOMECHANICS. Devices and Methods of Measurements. 2010;(1):85-94. (In Russ.)