SCANNING PROBE TECHNIQUES IN MICRO- AND NANOMECHANICS
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Abstract
Methods of materials local physics and mechanics properties estimation on the nanoscale are considered. The methods are realized on the base of AFM with surface mapping contrast, static and dynamics force spectroscopy and with the procedures of nanowear and oscillating microtribometry.
About the Authors
S. A. ChizhikBelarus
S. V. Siroezhlin
Belarus
References
1. Eletskii, A. V. Mekhanicheskie svoistva uglerodnykh nanostruktur i materialov na ikh osnove / A. V. Eletskii // Uspekhi fizicheskikh nauk. 2007. - T. 117. №3. - S. 233 - 274.
2. Bhushan, B. Applied Scanning Probe Methods / B. Bhushan, H. Fuchs, S. Hosaka // Springe, 2002. - 475 p.
3. Mironov, V. L. Osnovy skaniruyushchei zondovoi mikroskopii / V. L. Mironov; Institut fiziki mikrostruktur RAN. - Nizhnii Novgorod, 2004. - 110 s.
4. Suslov, A. A. Skaniruyushchie zondovye mikroskopy / A. A. Suslov, S. A.Chizhik // Materialy, tekhnologii, instrumenty. - 1997. - №3 - S. 78-89.
5. Chizhik, S. A. Kompleksnaya kharakterizatsiya materialov metodom skaniruyushchei zondovoi mikroskopii / S. A. Chizhik // Teploi massoperenos-2003 Minsk : Institut teploi massoobmena im. A.V. Lykova NAN Belarusi. - 2003. - S. 226 - 232.
6. Binnig, G. Scanning tunneling microscopy / G. Binnig, H. Rohrer // Helvetica Physica Acta. - 1982. №55 - R. 726.
7. Binnig, G. Atomic force microscopy / G. Binnig, C. F. Quate, Ch. Gerber // Phys. Rev. Lett. - 1986. №56 (9). - R. 930.
8. Burnham, N., Colton, R. J. Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope / N. Burnham, R. J. Colton // J.Vac. Sci. Technol. - 1989. - A 7. - R. 2906 - 13.
9. Chizhik, S. A. Micromechanical properties of elastic polymeric materials as probed by scanning force microscopy / S. A. Chizhik [ets.] // Langmuir. - 1998. - Vol. 14 - № 9. - P. 3012 - 3015.
10. Ahn, H.S. Application of phase contrast imaging atomic force microscopy to tribofilms on DLC coatings / H. S. Ahn // Wear. - 2001. - №249. - R. 617-625.
Review
For citations:
Chizhik S.A., Siroezhlin S.V. SCANNING PROBE TECHNIQUES IN MICRO- AND NANOMECHANICS. Devices and Methods of Measurements. 2010;(1):85-94. (In Russ.)
ISSN 2414-0473 (Online)