SCANNING PROBE TECHNIQUES IN MICRO- AND NANOMECHANICS

S. A. Chizhik; S. V. Siroezhlin

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SCANNING PROBE TECHNIQUES IN MICRO- AND NANOMECHANICS

S. A. Chizhik, S. V. Siroezhlin

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Abstract

Methods of materials local physics and mechanics properties estimation on the nanoscale are considered. The methods are realized on the base of AFM with surface mapping contrast, static and dynamics force spectroscopy and with the procedures of nanowear and oscillating microtribometry.

References

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For citations:

Chizhik S.A., Siroezhlin S.V. SCANNING PROBE TECHNIQUES IN MICRO- AND NANOMECHANICS. Devices and Methods of Measurements. 2010;(1):85-94. (In Russ.)

This work is licensed under a Creative Commons Attribution 4.0 License.

ISSN 2220-9506 (Print)
ISSN 2414-0473 (Online)

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Devices and Methods of Measurements

SCANNING PROBE TECHNIQUES IN MICRO- AND NANOMECHANICS

Full Text:

Abstract

About the Authors

References

Review

For citations:

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Devices and Methods of Measurements

SCANNING PROBE TECHNIQUES IN MICRO- AND NANOMECHANICS

Full Text:

Abstract

About the Authors

References

Review

For citations:

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