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Devices and Methods of Measurements

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For citations:

Kamyshan A.S., Komarov F.F., Danilevich V.V., Grishan P.A. COMPLEX FOR ELEMENTAL ANALYSIS OF SUBSURFACE LAYERS WITH NANOMETER DEPTH RESOLUTION. Devices and Methods of Measurements. 2010;(1):17-22. (In Russ.)



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ISSN 2220-9506 (Print)
ISSN 2414-0473 (Online)

Belarusian National Technical University
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