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Devices and Methods of Measurements

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Abetkovskaia S.O., Chizhik S.A., Yu G., Lapitskaya V.A. Complex Influence of Probe–Sample System Parameters on the Probe Oscillation Mode and Formation of Bistability in Tapping Atomic Force Microscopy. Devices and Methods of Measurements. 2026;17(2):141-150. https://doi.org/10.21122/2220-9506-2026-17-2-141-150

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ISSN 2220-9506 (Print)
ISSN 2414-0473 (Online)