EFFECTIVE SILICON DEVICE STRUCTURES WITH RADIATIVE RECOMBINATION ON DISLOCATIONS
Abstract
The efficient electroluminescence in the region of band-to-band (1,1 eV) and dislocationrelated (D1 – 0,8 eV) transitions has been detected from Si p-n structures at room and liquid nitrogen temperatures. It was found that dislocation-related luminescence in Si single crystals is considerably stronger than the intrinsic band-to-band emission in the wide temperature range of 4,2–300 K. The temperature dependent measurement of the D1 photoluminescence intensity shows that two energy levels placed below the conduction (0,04 eV) and above valence (0,32 eV) bands are responsible for this radiative recombination on dislocations.
About the Authors
A. V. MudryiBelarus
V. D. Zhivulko
Belarus
F. Mofidnakhaei
Belarus
G. D. Ivlev
Belarus
M. V. Yakushev
United Kingdom
R. W. Martin
United Kingdom
A. V. Dvurechenskii
Russian Federation
V. A. Zinovyev
Russian Federation
Zh. V. Smagina
Russian Federation
P. A. Kuchinskaja
Russian Federation
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Review
For citations:
Mudryi A.V., Zhivulko V.D., Mofidnakhaei F., Ivlev G.D., Yakushev M.V., Martin R.W., Dvurechenskii A.V., Zinovyev V.A., Smagina Zh.V., Kuchinskaja P.A. EFFECTIVE SILICON DEVICE STRUCTURES WITH RADIATIVE RECOMBINATION ON DISLOCATIONS. Devices and Methods of Measurements. 2014;(1):38-45. (In Russ.)