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Devices and Methods of Measurements

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For citations:

Tyavlovsky A.K., Zharin A.L., Gusev O.K., Varabei R.I., Muhurov N.I., Sharonov G.V., Pantsialeyeu K.U. ANALYSIS OF SURFACE DEFECTS OF ALUMINUM AND ITS ALLOYS WITH A SCANNING KELVIN PROBE. Devices and Methods of Measurements. 2017;8(1):61-72. (In Russ.) https://doi.org/10.21122/2220-9506-2017-8-1-61-72



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ISSN 2220-9506 (Print)
ISSN 2414-0473 (Online)

Belarusian National Technical University
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