THE ANALYSIS OF DIELECTRICS' SURFACE POTENTIAL MEASURING TECHNIQUE BASED ON A CURRENT FEEDBACK SCHEME
Abstract
The comparative analysis of time-varying probe methods of measurement of a surface potential is held. Regarding contactless measurement of dielectrics' surface potential in a wide range of meanings, a current feedback scheme is found to be optimal. Advantages of this scheme are high spatial resolution, a wide measuring range and an independence of output signal on a probe-to-surface gap in a certain range of gap meanings. Metrological characteristics of the scheme are analyzed resulting in a mathematical expression for a normalized methodical measurement error.
About the Authors
A. K. TyavlovskyBelarus
A. L. Zharin
Belarus
References
1. Ahmed, N. H. Review of space charge measurements in dielectrics / N. H. Ahmed, , N.N. Srinivas // IEEE transactions on dielectrics and electrical insulation. – 1997. – № 4 (5). – P. 644– 656.
2. Yarmchuk, E.J. High-resolution surface charge measurements on an organic photoreceptor / E.J. Yarmchuk, G.E. Keefe // J. Appl. Phys. – 1989. – V.66. – № 11. – P. 5435.
3. Palevsky, H. Design of dynamic condenser electrometer / H. Palevsky [et al.] // Review Of Scientific Instruments. – 1947. – V.18. – № 18(5). – P. 297–314.
4. Zharin, A. L. Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping / A.L. Zharin // Scanning Probe Microscopy in Nanoscience and Nanotechnology (edited by B. Bhushan). – Springer Heidelberg Dordrecht London New York, 2010. – P. 687– 720.
5. Тявловский, А.К. Применение трансимпедансных предусилителей в измерителях контактной разности потенциалов / А.К. Тявловский, А.Л. Жарин // Электроника-инфо. – 2010. – № 6. – С. 60–63.
6. Тявловский, А.К. Моделирование метрологических характеристик емкостных первичных преобразователей средств зондовой электрометрии / А.К. Тяв-ловский, О.К. Гусев, А.Л. Жарин // Приборы и методы измерений. – 2011. –№ 1 (2). – С. 122–127.
Review
For citations:
Tyavlovsky A.K., Zharin A.L. THE ANALYSIS OF DIELECTRICS' SURFACE POTENTIAL MEASURING TECHNIQUE BASED ON A CURRENT FEEDBACK SCHEME. Devices and Methods of Measurements. 2011;(2):136-144. (In Russ.)