Preview

Devices and Methods of Measurements

Advanced search

MATHEMATICAL MODELING OF A DISTANCE DEPENDENCE OF A SCANNING KELVIN PROBE LATERAL RESOLUTION

Abstract

A mathematical model of cylindrical shaped plane-ended scanning Kelvin probe output signal is proposed considering the case of an infinite plane sample's surface with local defects represented by dot charges. Modeling results were obtained for the case of two closely situated dot charges anddifferent combinations of scanning Kelvin probe tip's diameter and sample-to-probe gap. It was found that the most effective way to improve the lateral resolution of a scanning Kelvin probe is to reduce the sample-to-probe gap in line with the reduction of sensor's vibration amplitude.

About the Author

A. K. Tyavlovsky
Belarusian National Technical University
Belarus


References

1. Klein, U. Contact potential differences measurement: Short history and experimental setup for classroom demonstration / U. Klein, W. Vollmann [et al.] // IEEE Transactions on Education. – 2003. – № 46(3). – P. 338–344.

2. Cheran, L. Scanning Kelvin nanoprobe detection in materials science and biochemical analysis / L. Cheran, S. Sadeghi [et al.] // The Analyst. – 2005. – № 130. – P. 1569–1576.

3. Ouisse, T. Theory of electric force microscopy in the parametric amplification regime / T. Ouisse, M. Stark [et al.] // Physical Review. – 2005. – B. 71 (20). – Art. No. 205404.

4. Cheran, L. Work-function measurement by high resolution scanning Kelvin nanoprobe / L. Cheran, S. Johnstone [et al.] // Measurement Science and Technology. – 2007. – № 18. – P. 567–578.

5. McMurray, H.N. Probe diameter and probespecimen distance dependence in the lateral resolution of a scanning Kelvin probe / H.N. McMurray, G. Williams // Journal of Applied Physics. – 2002. – V. 91. – № 3. – P. 1673–1679.

6. Иродов, И.Е. Основные законы электромагнетизма / И.Е. Иродов. – 2-е изд. Учебное пособие для студентов вузов. – М. : Высш. шк., 1991. – 289 с.

7. Zharin, A. L. Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping / A.L. Zharin // Scanning Probe Microscopy in Nanoscience and Nanotechnology (edited by B. Bhushan). – Springer Heidelberg Dordrecht London New York, 2010. – P. 687– 720.

8. Taylor, D.M. Measuring techniques for electrostatics / D.M. Taylor // Journal of Electrostatics. – 2001. – № 51–52. – P. 502–508.

9. Jacobs, H.O. Surface potential mapping: A qualitative material contrast in SPM / H.O. Jacobs, H.F. Knapp, S. Miiller, A. Stemmer // Ultramicroscopy. – 1997. – № 69. – P. 39–49.

10. Baikie, I.D. Analysis of stray capacitance in the Kelvin method / I.D. Baikie [et al.] // Rev. Sci. Instrum. – V. 62. – № 3. – 1991.


Review

For citations:


Tyavlovsky A.K. MATHEMATICAL MODELING OF A DISTANCE DEPENDENCE OF A SCANNING KELVIN PROBE LATERAL RESOLUTION. Devices and Methods of Measurements. 2012;(1):30-36. (In Russ.)

Views: 1917


Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 License.


ISSN 2220-9506 (Print)
ISSN 2414-0473 (Online)