MATHEMATICAL MODELING OF A DISTANCE DEPENDENCE OF A SCANNING KELVIN PROBE LATERAL RESOLUTION
Abstract
References
1. Klein, U. Contact potential differences measurement: Short history and experimental setup for classroom demonstration / U. Klein, W. Vollmann [et al.] // IEEE Transactions on Education. – 2003. – № 46(3). – P. 338–344.
2. Cheran, L. Scanning Kelvin nanoprobe detection in materials science and biochemical analysis / L. Cheran, S. Sadeghi [et al.] // The Analyst. – 2005. – № 130. – P. 1569–1576.
3. Ouisse, T. Theory of electric force microscopy in the parametric amplification regime / T. Ouisse, M. Stark [et al.] // Physical Review. – 2005. – B. 71 (20). – Art. No. 205404.
4. Cheran, L. Work-function measurement by high resolution scanning Kelvin nanoprobe / L. Cheran, S. Johnstone [et al.] // Measurement Science and Technology. – 2007. – № 18. – P. 567–578.
5. McMurray, H.N. Probe diameter and probespecimen distance dependence in the lateral resolution of a scanning Kelvin probe / H.N. McMurray, G. Williams // Journal of Applied Physics. – 2002. – V. 91. – № 3. – P. 1673–1679.
6. Иродов, И.Е. Основные законы электромагнетизма / И.Е. Иродов. – 2-е изд. Учебное пособие для студентов вузов. – М. : Высш. шк., 1991. – 289 с.
7. Zharin, A. L. Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping / A.L. Zharin // Scanning Probe Microscopy in Nanoscience and Nanotechnology (edited by B. Bhushan). – Springer Heidelberg Dordrecht London New York, 2010. – P. 687– 720.
8. Taylor, D.M. Measuring techniques for electrostatics / D.M. Taylor // Journal of Electrostatics. – 2001. – № 51–52. – P. 502–508.
9. Jacobs, H.O. Surface potential mapping: A qualitative material contrast in SPM / H.O. Jacobs, H.F. Knapp, S. Miiller, A. Stemmer // Ultramicroscopy. – 1997. – № 69. – P. 39–49.
10. Baikie, I.D. Analysis of stray capacitance in the Kelvin method / I.D. Baikie [et al.] // Rev. Sci. Instrum. – V. 62. – № 3. – 1991.
Review
For citations:
Tyavlovsky A.K. MATHEMATICAL MODELING OF A DISTANCE DEPENDENCE OF A SCANNING KELVIN PROBE LATERAL RESOLUTION. Devices and Methods of Measurements. 2012;(1):30-36. (In Russ.)