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Machine Learning in Understanding the Initial Interaction of the Atomic Force Microscope Probe with the Surface

https://doi.org/10.21122/2220-9506-2026-17-1-77-86

Abstract

Reliable determination of the tip-surface contact in atomic force microscopy measurements is necessary for structural and physico-mechanical analysis of the surface properties. Transition from non-contact interaction to contact one during experiments in air environment is accompanied by a rapid jump of the tip to the surface. High velocity of the tip movement in the area of non-contact interaction and the relatively low rate of the atomic force microscopy data capture do not allow determining of the onset of contact from the points of the force curve especially in the case of a deformable surface. The proposed solution is to use machine learning algorithms trained on model results. The interaction of the tip with the surface was modeled using a harmonic oscillator varying parameters of the probe, the material, and the experiment. As a result deflection of the probe in the moment of contact is predicted using input experimental parameters. Use of the developed algorithms is demonstrated by treating the results of the indentation of polyethylene. The obtained contact deflections are significantly differ from the available points of the experimental curves.

About the Author

I. A. Morozov
Institute of Continuous Media Mechanics Ural Branch of the Russian Academy of Sciences
Russian Federation

Address for correspondence:
Institute of Continuous Media Mechanics,
Ural Branch of the Russian Academy of Sciences,
Academician Korolev str., 1,
Perm
614013,
Russia
 imorozov@icmm.ru



References

1. Wang D, Fujinami S, Nakajima K, Nishi T. True Surface Topography and Nanomechanical Mapping Measurements on Block Copolymers with Atomic Force Microscopy. Macromolecules. 2010;43(7):3169-3172. DOI: 10.1021/ma9028695

2. Dehnert M, Spitzner E-C, Beckert F, Friedrich C, Magerle R. Subsurface Imaging of Functionalized and Polymer-Grafted Graphene Oxide. Macromolecules. 2016;49(19):7415-7425. DOI: 10.1021/acs.macromol.6b01519

3. Morozov IA. Subsurface AFM Study of Inhomogeneous Polymeric Materials. Journal of Applied Polymer Science. 2025;142(11):e56611. DOI: 10.1002/app.56611

4. Stühn L, Fritschen A, Choy J, Dehnert M, Dietz C. Nanomechanical sub-surface mapping of living biological cells by force microscopy. Nanoscale. 2019;11(27):1308913097. DOI: 10.1039/C9NR03497H

5. Gisbert VG, Garcia R. Fast and high-resolution mapping of van der Waals forces of 2D materials interfaces with bimodal AFM. Nanoscale. 2023;15(47):1919619202. DOI: 10.1039/D3NR05274E

6. Morozov IA, Izumov RI. Influence of experimental conditions on apparent AFM tip-surface contact in air. Ultramicroscopy. 2025;273:114148. DOI: 10.1016/j.ultramic.2025.114148

7. Cao Y, Yang D, Soboyejoy W. Nanoindentation Method for Determining the Initial Contact and Adhesion Characteristics of Soft Polydimethylsiloxane. J. Mater. Res. Springer Science and Business Media LLC. 2005;20(8):2004-2011. DOI: 10.1557/jmr.2005.0256

8. Garcia M, Schulze KD, O’Bryan CS, Bhattacharjee T, Sawyer WG, Angelini TE. Eliminating the surface location from soft matter contact mechanics measurements. Tribology – Materials, Surfaces & Interfaces. 2017;11(4):187-192. DOI: 10.1080/17515831.2017.1397908

9. Yang C-W, Chen C-H, Ding R-F, Liao H-S, Hwang I-S. Multiparametric characterization of heterogeneous soft materials using contact point detectionbased atomic force microscopy. Applied Surface Science. 2020;522:146423. DOI: 10.1016/j.apsusc.2020.146423

10. Hadjiiski L, Linnemann R, Stopka M, Oesterschulze E, Rangelow I, Kassing R. Application of neural networks to a scanning probe microscopy system. Thin Solid Films. 1995;264(2):291-297. DOI: 10.1016/0040-6090(95)05851-6

11. Liu Y, Sun Q, Lu W, Wang H, Sun Y, Wang Z, Lu X, Zeng K. General Resolution Enhancement Method in Atomic Force Microscopy Using Deep Learning. Advanced Theory and Simulations. 2019;2(2):1800137. DOI: 10.1002/adts.201800137

12. Li M, Rieck J, Noheda B, Roerdink JBTM, Wilkinson MHF. Stripe noise removal in conductive atomic force microscopy. Sci Rep. 2024;14(1):3931. DOI: 10.1038/s41598-024-54094-w

13. Nartova AV, Mashukov MYu, Astakhov RR, Kudinov VYu, Matveev AV, Okunev AG. Particle Recognition on Transmission Electron Microscopy Images Using Computer Vision and Deep Learning for Catalytic Applications. Catalysts. 2022;12(2):135. DOI: 10.3390/catal12020135

14. Anantatamukala A, Krishna KVM, Dahotre NB. Generative adversarial networks assisted machine learning based automated quantification of grain size from scanning electron microscope back scatter images. Materials Characterization. 2023;206:113396. DOI: 10.1016/j.matchar.2023.113396

15. Giergiel M, Zapotoczny B, Czyzynska-Cichon I, Konior J, Szymonski M. AFM image analysis of porous structures by means of neural networks. Biomedical Signal Processing and Control. 2022;71:103097. DOI: 10.1016/j.bspc.2021.103097

16. Kim Y, Gu GH, Asghari-Rad P, Noh J, Rho J, Seo MH, Kim HS. Novel deep learning approach for practical applications of indentation. Materials Today Advances. 2022;13:100207. DOI: 10.1016/j.mtadv.2022.100207

17. Weber A, Vivanco M. dM, Toca-Herrera JL. Application of self-organizing maps to AFM-based viscoelastic characterization of breast cancer cell mechanics. Sci Rep. 2023;13(1):3087. DOI: 10.1038/s41598-023-30156-3

18. Sotres J, Boyd H, Gonzalez-Martinez JF. Locating critical events in AFM force measurements by means of one-dimensional convolutional neural networks. Sci Rep. 2022;12(1):12995. DOI: 10.1038/s41598-022-17124-z

19. Jeong K, Lee H, Kwon OM, Jung J, Kwon D, Han HN. Prediction of uniaxial tensile flow using finite element-based indentation and optimized artificial neural networks. Materials & Design. 2020;196:109104. DOI: 10.1016/j.matdes.2020.109104

20. Bao M, Yang H. Squeeze film air damping in MEMS. Sensors and Actuators A: Physical. 2007;136(1):3-27. DOI: 10.1016/j.sna.2007.01.008

21. Clifford CA, Seah MP. The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis. Nanotechnology. 2005;16(9):1666-1680. DOI: 10.1088/0957-4484/16/9/044

22. Payam AF, Morelli A, Lemoine P. Multiparametric analytical quantification of materials at nanoscale in tapping force microscopy. Applied Surface Science. 2021;536:147698. DOI: 10.1016/j.apsusc.2020.147698


Review

For citations:


Morozov I.A. Machine Learning in Understanding the Initial Interaction of the Atomic Force Microscope Probe with the Surface. Devices and Methods of Measurements. 2026;17(1):77-86. (In Russ.) https://doi.org/10.21122/2220-9506-2026-17-1-77-86

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ISSN 2220-9506 (Print)
ISSN 2414-0473 (Online)