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Devices and Methods of Measurements

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Yuhnovskaya O.V., Hundzina M.A., Romashko E.D., Pantsialeyeu K.U. Statistical Detection and Removal of Noise Outliers in Visualized Probe Electrometry Data. Devices and Methods of Measurements. 2025;16(4):406-416. (In Russ.) https://doi.org/10.21122/2220-9506-2025-16-4-406-416

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ISSN 2220-9506 (Print)
ISSN 2414-0473 (Online)