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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">pimi</journal-id><journal-title-group><journal-title xml:lang="ru">Приборы и методы измерений</journal-title><trans-title-group xml:lang="en"><trans-title>Devices and Methods of Measurements</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2220-9506</issn><issn pub-type="epub">2414-0473</issn><publisher><publisher-name>BNTU</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.21122/2220-9506-2020-11-2-122-131</article-id><article-id custom-type="elpub" pub-id-type="custom">pimi-649</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Средства измерений</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>Measuring instruments</subject></subj-group></article-categories><title-group><article-title>Оценка влияния температурных эффектов в схемах геометрической калибровки оптико-электронных аппаратов</article-title><trans-title-group xml:lang="en"><trans-title>Assessment of Temperature Effects in Interior Orientation Parameters Calibration of Optoelectronic Devices</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Старосотников</surname><given-names>Н. О.</given-names></name><name name-style="western" xml:lang="en"><surname>Starasotnikau</surname><given-names>M. A.</given-names></name></name-alternatives><bio xml:lang="ru"><p>Адрес для переписки: Н.О. Старосотников – ОАО «Пеленг», ул. Макаенка, 25, г. Минск 220114     </p><p> e-mail: starasotnikau@gmail.com</p></bio><bio xml:lang="en"><p>Address for correspondence: M.A. Starasotnikau – JSC “Peleng”, Makayonka str., 2, Minsk 220114, Belarus</p><p>e-mail: starasotnikau@gmail.com</p></bio><email xlink:type="simple">starasotnikau@gmail.com</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Пеленг ОАО</institution><country>Беларусь</country></aff><aff xml:lang="en"><institution>Peleng JSC</institution><country>Belarus</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2020</year></pub-date><pub-date pub-type="epub"><day>26</day><month>06</month><year>2020</year></pub-date><volume>11</volume><issue>2</issue><fpage>122</fpage><lpage>131</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Старосотников Н.О., 2020</copyright-statement><copyright-year>2020</copyright-year><copyright-holder xml:lang="ru">Старосотников Н.О.</copyright-holder><copyright-holder xml:lang="en">Starasotnikau M.A.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://pimi.bntu.by/jour/article/view/649">https://pimi.bntu.by/jour/article/view/649</self-uri><abstract><p>При использовании цифрового микрозеркального устройства (Digital Micromirror Device – DMD) в качестве тест-объекта, периодическая структура микрозеркал которого является измерительной шкалой, в частности, в задачах геометрической калибровки оптико-электронных аппаратов (ОЭА), важно, чтобы пространственная структура микрозеркал оставалась постоянной. Изменение пространственной структуры может произойти из-за нагрева. Помимо нагрева DMD, фотоприёмник ОЭА также подвержен нагреву, и соответственно изменению его пространственной структуры. Цель работы заключалась в оценке величины изменения пространственной структуры DMD и фотоприёмника ОЭА. Проведён анализ пространственного дрейфа микрозеркал DMD и пространственного дрейфа микрозеркал DMD совместно с пространственным дрейфом пикселей фотоприёмника цифровой камеры за 4 ч работы. Анализ дрейфа заключался в оценке положения массива точек сформированного DMD и спроецированного на цифровую камеру. Для исключения влияния цифровой камеры при анализе дрейфа обусловленного микрозеркалами DMD цифровая камера включалась только в течении съёмки. За это время цифровая камера не успевала существенно нагреться. После чего она остывала до температуры помещения.</p><p>Средняя величина дрейфа всех микрозеркал влияет на точность при необходимости геометрической калибровки ОЭА при помощи DMD длительное время. После включения наблюдается максимальный дрейф всех микрозеркал. Чтобы средняя величина дрейфа всех микрозеркал была не более 1 мкм необходимо минимальное время прогрева DMD – 60 мин. При использовании DMD совместно с цифровой камерой требуемое минимальное время прогрева DMD – 120 мин.</p><p>Равномерность расширения DMD будет определять точность геометрической калибровки ОЭА с помощью DMD, поскольку при неравномерном расширении будет нарушаться периодичность микрозеркал, т. е. не будет известно взаимное расположение микрозеркал друг относительно друга. Среднее изменение расстояний между соседними точками – не более 0,1 мкм за каждые 20 мин работы.</p><p>Таким образом, DMD можно использовать в качестве тест-объекта в задачах геометрической калибровки ОЭА. При необходимости более точных геометрических калибровок ОЭА полученные результаты можно использовать в качестве коэффициентов компенсации изменения пространственной структуры DMD из-за температурных эффектов в процессе работы.</p></abstract><trans-abstract xml:lang="en"><p>A digital micromirror device (DMD) micromirrors periodic spatial structure is a measuring scale in interior orientation parameters calibration of optoelectronic devices problems, when using a DMD as a testobject. It is important that DMD micromirrors periodic spatial structure remains constant. Change in a DMD micromirrors spatial structure may occur due to heating. In addition to heating a DMD, an optoelectronic device photodetector is also subject to heating and, accordingly, change in its spatial structure. It is necessary to estimate change in a spatial structure of DMD micromirrors and an optoelectronic device photodetector.</p><p>A DMD micromirrors spatial drift and a DMD micromirrors spatial drift together with a digital camera photodetector pixels spatial drift for operation 4 h are analyzed. The drift analysis consisted in the points array position assessing formed by a DMD and projected onto a digital camera. When analyzing only a DMD micromirrors drift, a digital camera was turned on only for shooting time for exclude digital camera influence. A digital camera did not have time to significantly heat up, during this time. After a digital camera it cooled to a room temperature.</p><p>Average drift of all DMD micromirrors determines the accuracy of interior orientation parameters calibration of optoelectronic devices using a DMD in time. Maximum drift of all micromirrors after switching on is observed. Minimum DMD warm-up time is 60 min for average drift of all micromirrors less than 1 μm is necessary. Minimum DMD warm-up time is 120 min when using a DMD together with a digital camera is necessary.</p><p>A DMD expansion uniformity determines the accuracy of interior orientation parameters calibration of optoelectronic devices using a DMD, because irregular expansion disturbs micromirrors periodicity. The average change in distance of neighboring points is less than 0.1 μm for every 20 min.</p><p>Thus, a DMD can be used as a test-object in interior orientation parameters calibration of optoelectronic devices. The results can be used as compensation coefficients of change in DMD micromirrors spatial structure due to temperature effects during operation, if more accurate are necessary.</p><p> </p></trans-abstract><kwd-group xml:lang="ru"><kwd>геометрическая калибровка</kwd><kwd>оптико-электронный аппарат</kwd><kwd>температурный дрейф</kwd><kwd>фотоприёмник</kwd><kwd>цифровое микрозеркальное устройство</kwd></kwd-group><kwd-group xml:lang="en"><kwd>DMD</kwd><kwd>optoelectronic device</kwd><kwd>interior orientation parameters</kwd><kwd>photodetector</kwd><kwd>temperature drift</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Zhengrong Huang, Jiangtao Xi., Yanguang Yu., Qinghua Guo. Accurate Projector Calibration Based on a New Point to Point Mapping Relationship Between the Camera and Projector Images. Applied Optics, 2015, vol. 54, iss. 3, pp. 347–356. 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