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<!DOCTYPE article PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.3 20210610//EN" "JATS-journalpublishing1-3.dtd">
<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">pimi</journal-id><journal-title-group><journal-title xml:lang="ru">Приборы и методы измерений</journal-title><trans-title-group xml:lang="en"><trans-title>Devices and Methods of Measurements</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2220-9506</issn><issn pub-type="epub">2414-0473</issn><publisher><publisher-name>BNTU</publisher-name></publisher></journal-meta><article-meta><article-id pub-id-type="doi">10.21122/2220-9506-2011-0-1-104-110</article-id><article-id custom-type="elpub" pub-id-type="custom">pimi-175</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Метрологическое обеспечение измерений</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>Metrological assurance of measurements</subject></subj-group></article-categories><title-group><article-title>МОДЕЛИРОВАНИЕ МЕТРОЛОГИЧЕСКИХ ХАРАКТЕРИСТИК ЕКОСТНЫХ ПЕРВИЧНЫХ ПРЕОБРАЗОВАТЕЛЕЙ СРЕДСТВ ЗОНДВОЙ ЭЛЕКТРОМЕТРИИ</article-title><trans-title-group xml:lang="en"><trans-title>METROLOGICAL PERFORMANCE MODELING OF PROBE ELECTROMETERS CAPACITIVE SENSORS</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Тявловский</surname><given-names>А. К.</given-names></name><name name-style="western" xml:lang="en"><surname>Tyavlovsky</surname><given-names>A. K.</given-names></name></name-alternatives><email xlink:type="simple">pimi@bntu.by</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Гусев</surname><given-names>О. К.</given-names></name><name name-style="western" xml:lang="en"><surname>Gusev</surname><given-names>O. K.</given-names></name></name-alternatives><email xlink:type="simple">pimi@bntu.by</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Жарин</surname><given-names>А. Л.</given-names></name><name name-style="western" xml:lang="en"><surname>Zharin</surname><given-names>A. L.</given-names></name></name-alternatives><email xlink:type="simple">pimi@bntu.by</email><xref ref-type="aff" rid="aff-1"/></contrib></contrib-group><aff-alternatives id="aff-1"><aff xml:lang="ru"><institution>Белорусский национальный технический университет</institution><country>Беларусь</country></aff><aff xml:lang="en"><institution>Belarusian National Technical University</institution><country>Belarus</country></aff></aff-alternatives><pub-date pub-type="collection"><year>2011</year></pub-date><pub-date pub-type="epub"><day>29</day><month>04</month><year>2015</year></pub-date><volume>0</volume><issue>1</issue><fpage>122</fpage><lpage>127</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Тявловский А.К., Гусев О.К., Жарин А.Л., 2015</copyright-statement><copyright-year>2015</copyright-year><copyright-holder xml:lang="ru">Тявловский А.К., Гусев О.К., Жарин А.Л.</copyright-holder><copyright-holder xml:lang="en">Tyavlovsky A.K., Gusev O.K., Zharin A.L.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://pimi.bntu.by/jour/article/view/175">https://pimi.bntu.by/jour/article/view/175</self-uri><abstract><p>Для определения функции преобразования емкостного первичного преобразователя зондового электрометра использован метод комплексно-гармонического анализа. Получено выражение, позволяющее анализировать метрологические характеристики цепи, содержащей динамический конденсатор при любых значениях ее параметров. Проанализированы амплитудно-частотные и фазочастотные характеристики цепи и выработаны рекомендации по использованию различных участков частотной характеристики при проектировании средств измерений на основе динамического конденсатора.</p></abstract><trans-abstract xml:lang="en"><p>A transducer function of probe electrometer’s primary capacitive sensor was calculated using a harmonic complex analysis technique. The obtained expression allows analyzing metrological characteristics of the circuit containing the dynamic capacitor at any values of its parameters. Study of circuit's peak-frequency and phase-frequency characteristics was held giving recommendations on using of different parts of frequency characteristic when designing measuring systems on a basis of dynamic capacitor.</p></trans-abstract></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Lonardo, P. M. Emerging Trends in Surface Metrology / P. M. Lonardo, D. A. [et al.] // CIRP Annals Manufacturing Technology. – 2002. – № 51(2). – P. 701–723.</mixed-citation><mixed-citation xml:lang="en">Lonardo, P. M. Emerging Trends in Surface Metrology / P. M. Lonardo, D. A. [et al.] // CIRP Annals Manufacturing Technology. – 2002. – № 51(2). – P. 701–723.</mixed-citation></citation-alternatives></ref><ref id="cit2"><label>2</label><citation-alternatives><mixed-citation xml:lang="ru">Booth, J. E. Scuffing detection of TU3 camfollower contacts by electrostatic charge condition monitoring / J. E. 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Taylor // Journal of Electrostatics. – 2001. – № 51–52. – P. 502–508.</mixed-citation></citation-alternatives></ref></ref-list><fn-group><fn fn-type="conflict"><p>The authors declare that there are no conflicts of interest present.</p></fn></fn-group></back></article>
