pimiПриборы и методы измеренийDevices and Methods of Measurements2220-95062414-0473BNTUpimi-15Research ArticleСредства измеренийMeasuring instrumentsМИКРОЗОНДЫ ДЛЯ ОПРЕДЕЛЕНИЯ СИЛЫ АДГЕЗИИ И УДЕЛЬНОЙ ПОВЕРХНОСТНОЙ ЭНЕРГИИ МЕТОДОМ АТОМНО-СИЛОВОЙ МИКРОСКОПИИMICROPROBE FOR DETERMINATION OF ADHESION FORCE AND THE SPECIFIC SURFACE ENERGY BY AFMКузнецоваТ. А.KuznetsovaT. A.kuz06@mail.ruЧижикН. В.ChizikN. V.kuz06@mail.ruШиряеваТ. И.ShiryaevaT. I.kuz06@mail.ruБелорусский национальный технический университетBelarus201330032015014145Copyright © Кузнецова Т.А., Чижик Н.В., Ширяева Т.И., 20152015Кузнецова Т.А., Чижик Н.В., Ширяева Т.И.Kuznetsova T.A., Chizik N.V., Shiryaeva T.I.Данная работа распространяется под лицензией Creative Commons Attribution 4.0.This work is licensed under a Creative Commons Attribution 4.0 License.https://pimi.bntu.by/jour/article/view/15

Представлены результаты использования метода атомно-силовой микроскопии в режиме силовой спектроскопии для определения значения сил адгезии между поверхностью наконечника микрозонда, выполненного из частицы титанового порошка диаметром 67 мкм, и поверхностями вакуумных покрытий из Au, Ti, Al, TiN, а также компактных полированных поверхностей из Al, Ti, нержавеющей стали.

Results of usage of atomic force microscopy method operated in force spectroscopy mode for determining of the values of the adhesion forces between the probe tip (made from titanium powder particle with diameter of 67m) and Au, Ti, Al, TiN vacuum-deposited coatings, as well as bulk Al, Ti, stainless steel ones.

 

атомно-силовая микроскопиязонднаконечник.atomic force microscopyprobetipReferencesDrelich, Ed. J. Atomic Force Microscopy in Adhesion Studies / Ed. J. Drelich [et al]. – Boston : Brill Academic Pub. – 2005. – 822 pp.Drelich, Ed. J. Atomic Force Microscopy in Adhesion Studies / Ed. J. Drelich [et al]. – Boston : Brill Academic Pub. – 2005. – 822 pp.Ferreiraa, O. Adhesion experiments using an AFM — Parameters of influence / O. Ferreiraa [et al] // Applied Surface Science. – 2010. – V. 257. – P. 48–55.Ferreiraa, O. Adhesion experiments using an AFM — Parameters of influence / O. Ferreiraa [et al] // Applied Surface Science. – 2010. – V. 257. – P. 48–55.Israelachvili, J.N. Intermolecular and surface forces : 2nd ed / J.N. Israelachvili. – New York : Academic Press. – 1992. – 470 pр.Israelachvili, J.N. Intermolecular and surface forces : 2nd ed / J.N. Israelachvili. – New York : Academic Press. – 1992. – 470 pр.Zhanga, W. Interaction force measurement between E. coli cells and nanoparticles immobilized surfaces by using AFM / W. Zhanga, A.G. Stackb, Y. Chena // Colloids and Surfaces B: Biointerfaces. – 2011. – V. 82. – P. 316–324.Zhanga, W. Interaction force measurement between E. coli cells and nanoparticles immobilized surfaces by using AFM / W. Zhanga, A.G. Stackb, Y. Chena // Colloids and Surfaces B: Biointerfaces. – 2011. – V. 82. – P. 316–324.Sotres, J. AFM Imaging and Analysis of Electrostatic Double Layer Forces on Single DNA Molecules / J. Sotres and A. M. Baro // Biophysical Journal Volume. – 2010. – V. 98. – P. 1995–2004.Sotres, J. AFM Imaging and Analysis of Electrostatic Double Layer Forces on Single DNA Molecules / J. Sotres and A. M. Baro // Biophysical Journal Volume. – 2010. – V. 98. – P. 1995–2004.Götzinger, M. Dispersive forces of particle-surface interactions: direct AFM measurements and modelling / M. Götzinger, W. Peukert // Powder Technology. – 2003. – V. 130. – P. 102–109.Götzinger, M. Dispersive forces of particle-surface interactions: direct AFM measurements and modelling / M. Götzinger, W. Peukert // Powder Technology. – 2003. – V. 130. – P. 102–109.Inter-particle forces in cohesive powders studied by AFM: effects of relative humidity, particle size and wall adhesion R. Jonesa [et al] // Powder Technology. – 2003. – V.132. – P. 196– 210.Inter-particle forces in cohesive powders studied by AFM: effects of relative humidity, particle size and wall adhesion R. Jonesa [et al] // Powder Technology. – 2003. – V.132. – P. 196– 210.Thio, B.J. Measurement of polyamide and polystyrene adhesion with coated-tip atomic force microscopy / B. J. Thio, J. C. Meredith // Journal of Colloid and Interface Science. – 2007. – V. 314. – P. 52–62.Thio, B.J. Measurement of polyamide and polystyrene adhesion with coated-tip atomic force microscopy / B. J. Thio, J. C. Meredith // Journal of Colloid and Interface Science. – 2007. – V. 314. – P. 52–62.Study of the friction, adhesion and mechanical properties of single crystals, ceramics and ceramic coatings by AFM / J.J. Roaa [et al] // Journal of the European Ceramic Society. – 2011. – V. 31. – P. 429–449.Study of the friction, adhesion and mechanical properties of single crystals, ceramics and ceramic coatings by AFM / J.J. Roaa [et al] // Journal of the European Ceramic Society. – 2011. – V. 31. – P. 429–449.Investigation of adhesive and frictional behaviour of GeSbTe films with AFM/FFM / G. Xie [et al] // Tribology International. – 2009. – V. 42. – P. 183–189.Investigation of adhesive and frictional behaviour of GeSbTe films with AFM/FFM / G. Xie [et al] // Tribology International. – 2009. – V. 42. – P. 183–189.Fawzy, A.S. Probing nano-scale adhesion force between AFM and acid demineralized intertubular dentin: Moist versus dry dentin / A.S. Fawzy, A.M. Farghaly // Journal of dentistry. – 2009. – V. 37. – P.963–969.Fawzy, A.S. Probing nano-scale adhesion force between AFM and acid demineralized intertubular dentin: Moist versus dry dentin / A.S. Fawzy, A.M. Farghaly // Journal of dentistry. – 2009. – V. 37. – P.963–969.Study of interaction between silicon surfaces in dilute ammonia peroxide mixtures (APM) and their components using atomic force microscope (AFM) / S. Siddiqui [et al] // Microelectronic Engineering. – 2011. – V. 88. – P. 3442–3447.Study of interaction between silicon surfaces in dilute ammonia peroxide mixtures (APM) and their components using atomic force microscope (AFM) / S. Siddiqui [et al] // Microelectronic Engineering. – 2011. – V. 88. – P. 3442–3447.Interlaboratory round robin on cantilever calibration for AFM force spectroscopy / J. Riet [et al] // Ultramicroscopy. – 2011. – V. 111. – P. 1659–1669.Interlaboratory round robin on cantilever calibration for AFM force spectroscopy / J. Riet [et al] // Ultramicroscopy. – 2011. – V. 111. – P. 1659–1669.Evaluation of the particle–particle interactions in a toner by colloid probe AFM / M. Tanaka [et al.] / Powder Technology. – V. 183. – 2008. – P. 273–281.Evaluation of the particle–particle interactions in a toner by colloid probe AFM / M. Tanaka [et al.] / Powder Technology. – V. 183. – 2008. – P. 273–281.Дедков, Г.В. Нанотрибология: экспериментальные факты и теоретические модели / Г.В. Дедков // Успехи физических наук. – 2000. – Т. 170. – № 6. – С. 585–618.Дедков, Г.В. Нанотрибология: экспериментальные факты и теоретические модели / Г.В. Дедков // Успехи физических наук. – 2000. – Т. 170. – № 6. – С. 585–618.Свириденок, А.И. Механика дискретного фрикционного контакта / А.И. Свириденок, С.А. Чижик, М.И. Петроковец. – Минск : Навука i тэхнiка, 1990. – 272 с.Свириденок, А.И. Механика дискретного фрикционного контакта / А.И. Свириденок, С.А. Чижик, М.И. Петроковец. – Минск : Навука i тэхнiка, 1990. – 272 с.

The authors declare that there are no conflicts of interest present.