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<article article-type="research-article" dtd-version="1.3" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xml:lang="ru"><front><journal-meta><journal-id journal-id-type="publisher-id">pimi</journal-id><journal-title-group><journal-title xml:lang="ru">Приборы и методы измерений</journal-title><trans-title-group xml:lang="en"><trans-title>Devices and Methods of Measurements</trans-title></trans-title-group></journal-title-group><issn pub-type="ppub">2220-9506</issn><issn pub-type="epub">2414-0473</issn><publisher><publisher-name>BNTU</publisher-name></publisher></journal-meta><article-meta><article-id custom-type="elpub" pub-id-type="custom">pimi-102</article-id><article-categories><subj-group subj-group-type="heading"><subject>Research Article</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="ru"><subject>Методы измерений, контроля, диагностики</subject></subj-group><subj-group subj-group-type="section-heading" xml:lang="en"><subject>Methods of measurements, monitoring, diagnostics</subject></subj-group></article-categories><title-group><article-title>ВЫСОКОЧАСТОТНЫЙ Er3+,Yb3+:YAl3(BO3)4 МИКРОЧИП-ЛАЗЕР С ПРОДОЛЬНОЙ ДИОДНОЙ НАКАЧКОЙ</article-title><trans-title-group xml:lang="en"><trans-title>HIGH REPETITION RATE MICROCHIP ER3+,YB3+:YAL3(BO3)4 DIODE-PUMPED LASER</trans-title></trans-title-group></title-group><contrib-group><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Горбаченя</surname><given-names>К. Н.</given-names></name><name name-style="western" xml:lang="en"><surname>Gorbachenya</surname><given-names>K. N.</given-names></name></name-alternatives><email xlink:type="simple">gorby@bntu.by</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Кисель</surname><given-names>В. Э.</given-names></name><name name-style="western" xml:lang="en"><surname>Kisel</surname><given-names>V. E.</given-names></name></name-alternatives><email xlink:type="simple">gorby@bntu.by</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Ясюкевич</surname><given-names>А. С.</given-names></name><name name-style="western" xml:lang="en"><surname>Yasukevich</surname><given-names>A. S.</given-names></name></name-alternatives><email xlink:type="simple">gorby@bntu.by</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Кулешов</surname><given-names>Н. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Kuleshov</surname><given-names>N. V.</given-names></name></name-alternatives><email xlink:type="simple">gorby@bntu.by</email><xref ref-type="aff" rid="aff-1"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Мальцев</surname><given-names>В. В.</given-names></name><name name-style="western" xml:lang="en"><surname>Maltsev</surname><given-names>V. V.</given-names></name></name-alternatives><email xlink:type="simple">gorby@bntu.by</email><xref ref-type="aff" rid="aff-2"/></contrib><contrib contrib-type="author" corresp="yes"><name-alternatives><name name-style="eastern" xml:lang="ru"><surname>Леонюк</surname><given-names>Н. И.</given-names></name><name name-style="western" xml:lang="en"><surname>Leonyuk</surname><given-names>N. I.</given-names></name></name-alternatives><email xlink:type="simple">gorby@bntu.by</email><xref ref-type="aff" rid="aff-2"/></contrib></contrib-group><aff xml:lang="ru" id="aff-1"><institution>Научно-исследовательский центр оптических материалов и технологий БНТУ г. Минск</institution><country>Belarus</country></aff><aff xml:lang="ru" id="aff-2"><institution>Московский государственный университет им. М. Ломоносова</institution><country>Russian Federation</country></aff><pub-date pub-type="collection"><year>2012</year></pub-date><pub-date pub-type="epub"><day>24</day><month>04</month><year>2015</year></pub-date><volume>0</volume><issue>2</issue><fpage>79</fpage><lpage>82</lpage><permissions><copyright-statement>Copyright &amp;#x00A9; Горбаченя К.Н., Кисель В.Э., Ясюкевич А.С., Кулешов Н.В., Мальцев В.В., Леонюк Н.И., 2015</copyright-statement><copyright-year>2015</copyright-year><copyright-holder xml:lang="ru">Горбаченя К.Н., Кисель В.Э., Ясюкевич А.С., Кулешов Н.В., Мальцев В.В., Леонюк Н.И.</copyright-holder><copyright-holder xml:lang="en">Gorbachenya K.N., Kisel V.E., Yasukevich A.S., Kuleshov N.V., Maltsev V.V., Leonyuk N.I.</copyright-holder><license xml:lang="ru" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>Данная работа распространяется под лицензией Creative Commons Attribution 4.0.</license-p></license><license xml:lang="en" license-type="creative-commons-attribution" xlink:href="https://creativecommons.org/licenses/by/4.0/" xlink:type="simple"><license-p>This work is licensed under a Creative Commons Attribution 4.0 License.</license-p></license></permissions><self-uri xlink:href="https://pimi.bntu.by/jour/article/view/102">https://pimi.bntu.by/jour/article/view/102</self-uri><abstract><p>Представлены генерационные характеристики микрочип-лазера на кристалле Er,Yb:YAl3(BO3)4  в режиме пассивной модуляции добротности для применения в дальнометрии. При использовании кристалла Co2+:MgAl2O4 в качестве пассивного затвора максимальная средняя выходная мощность составила 315 мВт на длине волны 1522 нм c длительностью импульсов 5 нс и энергией 5,25 мкДж при частоте следования 60 кГц.</p></abstract><trans-abstract xml:lang="en"><p>Diode-pumped passively Q-switched microchip Er,Yb:YAl3(BO3)4 laser for range-finding has been demonstrated. By using a Co2+:MgAl2O4 as a saturable absorber TEM00–mode Q-switched average output power of 315 mW was demonstrated at 1522 nm with pulse duration of 5 ns and pulse energy of 5,25 μJ at a repetition rate of 60 kHz.</p></trans-abstract><kwd-group xml:lang="ru"><kwd>лазер</kwd><kwd>микрочип</kwd><kwd>эрбий</kwd><kwd>дальномер</kwd><kwd>пассивная модуляция добротности</kwd></kwd-group><kwd-group xml:lang="en"><kwd>laser</kwd><kwd>microchip</kwd><kwd>erbium</kwd><kwd>range finder</kwd><kwd>passively q-switched</kwd></kwd-group></article-meta></front><back><ref-list><title>References</title><ref id="cit1"><label>1</label><citation-alternatives><mixed-citation xml:lang="ru">Fluck, R. Eyesafe pulsed microchip laser using semiconductor saturable absorber mirrors / R. Fluck, R. Haring, R. Pascotta [et al.] // Appl. Phys. Lett. – 1998. – Vol. 72, № 25. – P. 3273–3275.</mixed-citation><mixed-citation xml:lang="en">Fluck, R. 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